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General aspects of the vapor growth of semiconductor crystals - a study based on DFT simulations of the NH3/NH2 covered GaN(0001) surface in hydrogen ambient

机译:半导体晶体气相生长的一般方面 - 一项研究   基于在氢气中NH3 / NH2覆盖的GaN(0001)表面的DFT模拟   周围

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摘要

Vapor growth of semiconductors is analyzed using recently obtained dependenceof the adsorption energy on the electron charge transfer between the surfaceadsorbed species and the bulk [Krukowski et al. J. Appl. Phys. 114 (2013)063507, Kempisty et al. ArXiv 1307.5778 (2013)]. Ab initio calculations wereperformed to study the physical properties of GaN(0001) surface in ammonia-richconditions, i.e. covered by mixture of NH3 molecules and NH2 radicals. TheFermi level is pinned at valence band maximum (VBM) and conduction band minimum(CBM) for full coverage by NH3 molecules and NH2 radicals, respectively. Forthe crossover content of ammonia of about 25% monolayer (ML), the Fermi levelis unpinned. It was shown that hydrogen adsorption energy depends on the dopingin the bulk for the unpinned Fermi level, i.e. for this coverage. Surfacestructure thermodynamic and mechanical stability criteria are defined andcompared. Mechanical stability of the coverage of such surfaces was checked bydetermination of the desorption energy of hydrogen molecules. Thermodynamicstability analysis indicates that initally equilibrium hydrogen vapor partialpressure steeply increases with NH3 content to attain the crossover NH3/NH2coverage, i.e. the unpinned Fermi level condition. For such condition theentire range of experimentally accessible pressures belongs showing that vaporgrowth of semiconductor crystals occurs predominantly for unpinned Fermi levelat the surface, i.e. for flat bands. Accordingly, adsorption energy of mostspecies depends on the doping in the bulk that is basis of the possiblemolecular scenario explaining dependence of the growth and the doping ofsemiconductor crystals on the doping in the bulk
机译:使用最近获得的吸附能对表面吸附物质与主体之间电子电荷转移的依赖性来分析半导体的蒸汽生长[Krukowski et al。 J.应用物理114(2013)063507,Kempisty等。 ArXiv 1307.5778(2013)。进行了从头算的计算,以研究在富氨条件下GaN(0001)表面的物理特性,即被NH3分子和NH2自由基的混合物覆盖。费米能级固定在价带最大值(VBM)和导带最小值(CBM),以分别被NH3分子和NH2自由基完全覆盖。对于约25%单层(ML)的氨气交叉含量,费米能级是不固定的。已经表明,对于未固定的费米能级,即对于该覆盖,氢的吸附能取决于主体中的掺杂。定义并比较了表面结构的热力学和机械稳定性标准。通过确定氢分子的解吸能来检查这种表面覆盖的机械稳定性。热力学稳定性分析表明,初始平衡氢蒸气分压随NH3含量急剧增加,以达到NH3 / NH2的跨度,即未固定的费米能级条件。对于这种条件,整个实验上可达到的压力范围表明,半导体晶体的汽相生长主要发生在表面的未固定费米能级,即平坦带上。因此,大多数种类的吸附能取决于主体中的掺杂,这是可能的分子情况的基础,解释了晶体生长和半导体晶体的掺杂对主体中掺杂的依赖性。

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